EUVD-2024-41758

Malicious code in bioql PyPI...

Intelligent Graybox Fuzzing Via ATPG-Guided Seed Generation and Submodule Analysis

Hardware Fuzzing emerged as one of the crucial techniques for finding security flaws in modern hardware designs by testing a wide range of input scenarios. One of the main challenges is creating high-quality input seeds that maximize coverage and speed up verification. Coverage-Guided Fuzzing CGF...

CVE-2024-45573

Memory corruption may occour while generating test pattern due to negative indexing of display ID...

CVE-2024-45573

CVE-2024-45573 : Memory corruption can occur when generating test patterns due to negative indexing of the display ID in Qualcomm chipsets. CVSS v3.1 base score 7.8 (HIGH) with LOCAL attacker, low privileges, no user interaction; impacts to confidentiality, integrity, and availability are noted a...

CVE-2024-45573 Use of Out-of-range Pointer Offset in Display

Memory corruption may occour while generating test pattern due to negative indexing of display ID...

PT-2025-2714

Name of the Vulnerable Software and Affected Versions: No specific software or versions are mentioned in the provided descriptions. Description: The issue is related to memory corruption that may occur while generating a test pattern due to negative indexing of the display ID. This can potentiall...