8706 matches found
CVE-2024-53017
Memory corruption while handling test pattern generator IOCTL command...
CVE-2025-27031
memory corruption while processing IOCTL commands, when the buffer in write loopback mode is accessed after being freed...
CVE-2024-53015
Memory corruption while processing IOCTL command to handle buffers associated with a session...
CVE-2025-27031
memory corruption while processing IOCTL commands, when the buffer in write loopback mode is accessed after being freed...
CVE-2024-53017
Memory corruption while handling test pattern generator IOCTL command...
CVE-2024-53015
Memory corruption while processing IOCTL command to handle buffers associated with a session...
CVE-2025-27031 Use After Free in Bluetooth HOST
memory corruption while processing IOCTL commands, when the buffer in write loopback mode is accessed after being freed...
CVE-2025-27031
CVE-2025-27031 affects Qualcomm chipsets. The vulnerability is a memory corruption in the kernel/driver path when handling IOCTLs: a buffer used in write loopback mode can be accessed after it has been freed, leading to potential arbitrary code execution or a crash. Affected component is describe...
CVE-2025-27031 Use After Free in Bluetooth HOST
memory corruption while processing IOCTL commands, when the buffer in write loopback mode is accessed after being freed...
CVE-2025-21485 Time-of-check Time-of-use (TOCTOU) Race Condition in DSP Service
Memory corruption while processing INIT and multimode invoke IOCTL calls on FastRPC...
CVE-2025-21485
CVE-2025-21485 is a memory corruption vulnerability in Qualcomm FastRPC, triggered while processing INIT and multimode IOCTL calls. Affects Qualcomm chipsets with FastRPC kernel interfaces; CVSS-like data from the published entry indicates local access, low attack complexity, and high impact acro...
CVE-2024-53017 Use of Out-of-range Pointer Offset in Camera Driver
Memory corruption while handling test pattern generator IOCTL command...
CVE-2024-53017 Use of Out-of-range Pointer Offset in Camera Driver
Memory corruption while handling test pattern generator IOCTL command...
CVE-2024-53017
CVE-2024-53017 concerns Qualcomm chipsets where the camera driver’s Test Pattern Generator IOCTL handling can trigger memory corruption. Multiple connected sources align on a root cause described as “Use of Out-of-range Pointer Offset in Camera Driver,” with local exploitation potential and parti...
CVE-2024-53015
CVE-2024-53015 describes a memory corruption issue in Qualcomm chipsets triggered when processing IOCTL commands to handle buffers for a session. The vulnerability affects IOCTL buffer handling code and is evidenced by multiple feeds (NVD and Red Hat advisories) reporting memory corruption withou...
CVE-2024-53015 Use After Free in Computer Vision
Memory corruption while processing IOCTL command to handle buffers associated with a session...
CVE-2024-53015 Use After Free in Computer Vision
Memory corruption while processing IOCTL command to handle buffers associated with a session...
PT-2025-23575 · Qualcomm · Snapdragon +4
Name of the Vulnerable Software and Affected Versions: The product name cannot be determined. Description: The issue is related to memory corruption that occurs while handling a test pattern generator IOCTL command. Recommendations: At the moment, there is no information about a newer version tha...
