CVE-2024-45573

Memory corruption may occour while generating test pattern due to negative indexing of display ID...

CVE-2024-45573

Memory corruption may occour while generating test pattern due to negative indexing of display ID...

CVE-2024-45573 Use of Out-of-range Pointer Offset in Display

Memory corruption may occour while generating test pattern due to negative indexing of display ID...

CVE-2024-45573 Use of Out-of-range Pointer Offset in Display

Memory corruption may occour while generating test pattern due to negative indexing of display ID...

CVE-2024-45573

CVE-2024-45573 : Memory corruption can occur when generating test patterns due to negative indexing of the display ID in Qualcomm chipsets. CVSS v3.1 base score 7.8 (HIGH) with LOCAL attacker, low privileges, no user interaction; impacts to confidentiality, integrity, and availability are noted a...