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nvd[email protected]NVD:CVE-2019-20607
HistoryMar 24, 2020 - 8:15 p.m.

CVE-2019-20607

2020-03-2420:15:13
CWE-787
web.nvd.nist.gov

10 High

CVSS2

Attack Vector

NETWORK

Attack Complexity

LOW

Authentication

NONE

Confidentiality Impact

COMPLETE

Integrity Impact

COMPLETE

Availability Impact

COMPLETE

AV:N/AC:L/Au:N/C:C/I:C/A:C

9.8 High

CVSS3

Attack Vector

NETWORK

Attack Complexity

LOW

Privileges Required

NONE

User Interaction

NONE

Scope

UNCHANGED

Confidentiality Impact

HIGH

Integrity Impact

HIGH

Availability Impact

HIGH

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

9.9 High

AI Score

Confidence

High

0.001 Low

EPSS

Percentile

50.5%

An issue was discovered on Samsung mobile devices with N(7.x), O(8.x), and P(9.0) (MSM8996, MSM8998, Exynos7420, Exynos7870, Exynos8890, and Exynos8895 chipsets) software. A heap overflow in the keymaster Trustlet allows attackers to write to TEE memory, and achieve arbitrary code execution. The Samsung ID is SVE-2019-14126 (May 2019).

Affected configurations

NVD
Node
googleandroidMatch7.0
OR
googleandroidMatch7.1.0
OR
googleandroidMatch7.1.1
OR
googleandroidMatch7.1.2
OR
googleandroidMatch8.0
OR
googleandroidMatch8.1
OR
googleandroidMatch9.0
AND
qualcommmsm8996Match-
OR
qualcommmsm8998Match-
OR
samsungexynos_7420Match-
OR
samsungexynos_7870Match-
OR
samsungexynos_8890Match-
OR
samsungexynos_8895Match-

10 High

CVSS2

Attack Vector

NETWORK

Attack Complexity

LOW

Authentication

NONE

Confidentiality Impact

COMPLETE

Integrity Impact

COMPLETE

Availability Impact

COMPLETE

AV:N/AC:L/Au:N/C:C/I:C/A:C

9.8 High

CVSS3

Attack Vector

NETWORK

Attack Complexity

LOW

Privileges Required

NONE

User Interaction

NONE

Scope

UNCHANGED

Confidentiality Impact

HIGH

Integrity Impact

HIGH

Availability Impact

HIGH

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

9.9 High

AI Score

Confidence

High

0.001 Low

EPSS

Percentile

50.5%

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