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EUVD-2026-112149

🗓️ 28 Oct 2026 15:42:11Reported by EUVDType 
euvd
 euvd
🔗 euvd.enisa.europa.eu👁 4 Views

Heap corruption in USB Test via malicious USB drive can cause DoS or code execution.

Related
Affected
Refs
ReporterTitlePublishedViews
Family
circl
Circl
CVE-2026-116776
28 Oct 202615:50
–circl
cve
CVE
CVE-2026-116776
28 Oct 202615:42
–cve
cvelist
Cvelist
CVE-2026-116776 USB Test: Heap-based Buffer Overflow in getSectorSize via untrusted DISK_GEOMETRY.BytesPerSector leads to RCE/DoS
28 Oct 202615:42
–cvelist
nvd
NVD
CVE-2026-116776
28 Oct 202616:17
–nvd
ptsecurity
Positive Technologies
PT-2026-128263
28 Oct 202600:00
–ptsecurity
[
  {
    "enisaIdVendor": [
      {
        "id": "efb41b9d-7b31-37a7-b682-cff5a312035e",
        "vendor": {
          "name": "n-romanovich"
        }
      }
    ],
    "enisaIdProduct": [
      {
        "id": "1e25c7bc-97ae-3fee-898d-302d3e9093c5",
        "product": {
          "name": "usb-test",
          "vendor": {
            "name": "n-romanovich"
          }
        },
        "product_version": "< 1.1.5"
      }
    ]
  }
]

Data

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28 Oct 2026 15:42Current
7.2High risk
Vulners AI Score7.2
CVSS 47
4