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EUVD-2017-9742

🗓️ 07 Oct 2025 00:30:54Reported by EUVDType 
euvd
 euvd
🔗 euvd.enisa.europa.eu👁 1 Views

Integer overflow in Samsung mobile devices M(6.x) and N(7.x) can cause memory corruption.

Related
Affected
Refs
ReporterTitlePublishedViews
Family
CNVD
Samsung Mobile Device Input Validation Error Vulnerability (CNVD-2020-32825)
8 Apr 202000:00
cnvd
CVE
CVE-2017-18651
7 Apr 202015:51
cve
Cvelist
CVE-2017-18651
7 Apr 202015:51
cvelist
NVD
CVE-2017-18651
7 Apr 202016:15
nvd
Prion
Integer overflow
7 Apr 202016:15
prion
RedhatCVE
CVE-2017-18651
22 May 202501:53
redhatcve
[
  {
    "enisaIdVendor": [
      {
        "id": "cdf46644-bed8-307a-985f-c3e342af16a8",
        "vendor": {
          "name": "n/a"
        }
      }
    ],
    "enisaIdProduct": [
      {
        "id": "6eef81bb-9a96-326e-a7ce-1472591c9caf",
        "product": {
          "name": "n/a"
        },
        "product_version": "n/a"
      }
    ]
  }
]

Data

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07 Oct 2025 00:30Current
7.5High risk
Vulners AI Score7.5
CVSS 3.17.5
CVSS 25
EPSS0.00113
1