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EUVD-2017-2355

🗓️ 07 Oct 2025 00:30:54Reported by EUVDType 
euvd
 euvd
🔗 euvd.enisa.europa.eu👁 1 Views

Lockscreen flaw on Elephone P9000 allows bypass of wrong-PIN lockout via backspace after guesses

Related
Affected
Refs
ReporterTitlePublishedViews
Family
CNVD
Elephone P9000 Lock Screen Lock Bypass Vulnerability
3 Jul 201700:00
cnvd
CVE
CVE-2017-10709
30 Jun 201716:00
cve
Cvelist
CVE-2017-10709
30 Jun 201716:00
cvelist
NVD
CVE-2017-10709
30 Jun 201716:29
nvd
OSV
CVE-2017-10709
30 Jun 201716:29
osv
Prion
Design/Logic Flaw
30 Jun 201716:29
prion
RedhatCVE
CVE-2017-10709
22 May 202511:02
redhatcve
[
  {
    "enisaIdVendor": [
      {
        "id": "8bd233c4-2cb1-3522-98a0-6050e6be0792",
        "vendor": {
          "name": "n/a"
        }
      }
    ],
    "enisaIdProduct": [
      {
        "id": "e3179de1-97e9-343f-86d6-a2c8e7fbaae8",
        "product": {
          "name": "n/a"
        },
        "product_version": "n/a"
      }
    ]
  }
]

Data

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07 Oct 2025 00:30Current
6.6Medium risk
Vulners AI Score6.6
CVSS 36.8
CVSS 27.2
EPSS0.00028
1