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cvelistMitreCVELIST:CVE-2019-20625
HistoryMar 24, 2020 - 7:41 p.m.

CVE-2019-20625

2020-03-2419:41:46
mitre
www.cve.org
3

AI Score

3.9

Confidence

High

EPSS

0

Percentile

12.6%

An issue was discovered on Samsung mobile devices with N(7.1) and O(8.x) (Exynos chipsets) software. The ion debugfs driver allows information disclosure. The Samsung ID is SVE-2018-13427 (February 2019).

AI Score

3.9

Confidence

High

EPSS

0

Percentile

12.6%

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