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cvelistQualcommCVELIST:CVE-2018-11279
HistoryJan 18, 2019 - 10:00 p.m.

CVE-2018-11279

2019-01-1822:00:00
qualcomm
www.cve.org
1

9 High

AI Score

Confidence

High

0.001 Low

EPSS

Percentile

31.8%

Lack of check of input size can make device memory get corrupted because of buffer overflow in snapdragon automobile, snapdragon mobile and snapdragon wear in versions MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130

CNA Affected

[
  {
    "product": "Snapdragon Automobile, Snapdragon Mobile, Snapdragon Wear",
    "vendor": "Qualcomm, Inc.",
    "versions": [
      {
        "status": "affected",
        "version": "MDM9206, MDM9607, MDM9615, MDM9625, MDM9635M, MDM9640, MDM9645, MDM9650, MDM9655, MSM8909W, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 427, SD 430, SD 435, SD 439 / SD 429, SD 450, SD 615/16/SD 415, SD 625, SD 636, SD 650/52, SD 712 / SD 710 / SD 670, SD 810, SD 820, SD 820A, SD 835, SD 845 / SD 850, SDA660, SDM439, SDM630, SDM660, SDX20, Snapdragon_High_Med_2016, SXR1130"
      }
    ]
  }
]

9 High

AI Score

Confidence

High

0.001 Low

EPSS

Percentile

31.8%

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