Lucene search

K
cve[email protected]CVE-2017-18696
HistoryApr 07, 2020 - 2:15 p.m.

CVE-2017-18696

2020-04-0714:15:13
CWE-119
web.nvd.nist.gov
25
samsung
mobile devices
memory corruption
sve-2016-7897
exynos7420
exynos8890
msm8996
nvd
cve-2017-18696

7.5 High

CVSS2

Attack Vector

NETWORK

Attack Complexity

LOW

Authentication

NONE

Confidentiality Impact

PARTIAL

Integrity Impact

PARTIAL

Availability Impact

PARTIAL

AV:N/AC:L/Au:N/C:P/I:P/A:P

9.8 High

CVSS3

Attack Vector

NETWORK

Attack Complexity

LOW

Privileges Required

NONE

User Interaction

NONE

Scope

UNCHANGED

Confidentiality Impact

HIGH

Integrity Impact

HIGH

Availability Impact

HIGH

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

9.4 High

AI Score

Confidence

High

0.001 Low

EPSS

Percentile

43.4%

An issue was discovered on Samsung mobile devices with M(6.0) and N(7.0) (Exynos7420, Exynos8890, or MSM8996 chipsets) software. RKP allows memory corruption. The Samsung ID is SVE-2016-7897 (January 2017).

Affected configurations

NVD
Node
googleandroidMatch6.0
OR
googleandroidMatch7.0
AND
qualcommmsm8996Match-
OR
samsungexynos_7420Match-
OR
samsungexynos_8890Match-

7.5 High

CVSS2

Attack Vector

NETWORK

Attack Complexity

LOW

Authentication

NONE

Confidentiality Impact

PARTIAL

Integrity Impact

PARTIAL

Availability Impact

PARTIAL

AV:N/AC:L/Au:N/C:P/I:P/A:P

9.8 High

CVSS3

Attack Vector

NETWORK

Attack Complexity

LOW

Privileges Required

NONE

User Interaction

NONE

Scope

UNCHANGED

Confidentiality Impact

HIGH

Integrity Impact

HIGH

Availability Impact

HIGH

CVSS:3.1/AV:N/AC:L/PR:N/UI:N/S:U/C:H/I:H/A:H

9.4 High

AI Score

Confidence

High

0.001 Low

EPSS

Percentile

43.4%

Related for CVE-2017-18696